Background
Chip resistors are widely used in NASA projects. However, cracking of the alumina substrate of these resistors is a rare occurrence. Joel W. Sills from the Langley Research Center is the contact person for more information on this topic.
Observation and Measurement Details
Two instances of cracking were observed after thermal cycling and vibration, with fractures occurring across the short axis. These events helped NASA evaluate its material and production processes.
Scientific Significance and Future Plans
These events helped NASA evaluate its material and production processes. In future projects, a more careful approach will be taken to prevent such problems. NASA continuously strives to improve its material and production processes.





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